Effect of europium ions on X-ray-induced defect formation in phosphate containing glasses

Abstract

The study of radiation-induced defect formation in glasses is of growing interest for applications in optics and photonics. The influence of Eu3+ and Eu2+ ions on X-ray-induced defects has been examined in glasses with different phosphate contents. The defects have been characterized by optical absorption and ESR spectroscopy. X-ray irradiation induces the formation of both (Eu3+)- and (Eu2+)+ ions, whereby the amount of the latter one is considerably higher. Furthermore, the stability of both ions at room temperature is different. In the fluoride phosphate glass studied, the local environment of (Eu3+)- differs from that of Eu2+ which is chemically created. (Eu3+)- ions suppress the formation of intrinsic electron centers, whereas (Eu2+)+ ions suppress the formation of intrinsic hole centers. The amount and stability of (Eu3+)- depend on glass composition and melting conditions. © 2002 Elsevier Science B.V. All rights reserved.