Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/116697
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Type: Journal article
Title: Improved application of carbon nanotube atomic force microscopy probes using peakforce tapping mode
Author: Slattery, A.
Shearer, C.
Shapter, J.
Blanch, A.
Quinton, J.
Gibson, C.
Citation: Nanomaterials, 2018; 8(10):1-13
Publisher: MDPI
Issue Date: 2018
ISSN: 2079-4991
2079-4991
Statement of
Responsibility: 
Ashley D. Slattery, Cameron J. Shearer, Joseph G. Shapter, Adam J. Blanch, Jamie S. Quinton and Christopher T. Gibson
Abstract: In this work PeakForce tapping (PFT) imaging was demonstrated with carbon nanotube atomic force microscopy (CNT-AFM) probes; this imaging mode shows great promise for providing simple, stable imaging with CNT-AFM probes, which can be difficult to apply. The PFT mode is used with CNT-AFM probes to demonstrate high resolution imaging on samples with features in the nanometre range, including a Nioprobe calibration sample and gold nanoparticles on silicon, in order to demonstrate the modes imaging effectiveness, and to also aid in determining the diameter of very thin CNT-AFM probes. In addition to stable operation, the PFT mode is shown to eliminate "ringing" artefacts that often affect CNT-AFM probes in tapping mode near steep vertical step edges. This will allow for the characterization of high aspect ratio structures using CNT-AFM probes, an exercise which has previously been challenging with the standard tapping mode.
Keywords: Carbon nanotubes; atomic force microscope tips; tapping mode; PeakForce tapping mode; imaging artefacts
Rights: © 2018 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
DOI: 10.3390/nano8100807
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