Please use this identifier to cite or link to this item: http://hdl.handle.net/2440/16595
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Type: Journal article
Title: Random numbers from metastability and thermal noise
Author: Ranasinghe, D.
Lim, D.
Devadas, S.
Abbott, D.
Cole, P.
Citation: Electronics Letters, 2005; 41(16):891-893
Publisher: IEE-Inst Elec Eng
Issue Date: 2005
ISSN: 0013-5194
Statement of
Responsibility: 
D.C. Ranasinghe, D. Lim, S. Devadas, D. Abbott and P.H. Cole
Abstract: Pseudorandom number generators are algorithmic and thus, predictable. Ideally cryptography, simulation and modelling applications require a source of true random numbers. Presented is a true random number generator that exploits metastablity and thermal noise. The novelty is that the low-cost design can be fully integrated with standard CMOS technology.
RMID: 0020051399
DOI: 10.1049/el:20051559
Appears in Collections:Electrical and Electronic Engineering publications

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