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https://hdl.handle.net/2440/16595
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Type: | Journal article |
Title: | Random numbers from metastability and thermal noise |
Author: | Ranasinghe, D. Lim, D. Devadas, S. Abbott, D. Cole, P. |
Citation: | Electronics Letters, 2005; 41(16):891-893 |
Publisher: | IEE-Inst Elec Eng |
Issue Date: | 2005 |
ISSN: | 0013-5194 1350-911X |
Statement of Responsibility: | D.C. Ranasinghe, D. Lim, S. Devadas, D. Abbott and P.H. Cole |
Abstract: | Pseudorandom number generators are algorithmic and thus, predictable. Ideally cryptography, simulation and modelling applications require a source of true random numbers. Presented is a true random number generator that exploits metastablity and thermal noise. The novelty is that the low-cost design can be fully integrated with standard CMOS technology. |
DOI: | 10.1049/el:20051559 |
Published version: | http://dx.doi.org/10.1049/el:20051559 |
Appears in Collections: | Aurora harvest 6 Electrical and Electronic Engineering publications |
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