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Type: Conference paper
Title: Advanced text authorship detection methods and their application to biblical texts
Author: Putnins, T.
Signoriello, D.
Jain, S.
Berryman, M.
Abbott, D.
Citation: Proceedings of SPIE, 2006 / Bender, A. (ed./s), vol.6039, pp.60390J-1-60390J-13
Publisher: SPIE
Publisher Place:
Issue Date: 2006
Series/Report no.: Proceedings of SPIE--The International Society for Optical Engineering ; 6039
ISBN: 0-8194-6070-2
ISSN: 0277-786X
Conference Name: SPIE Microelectronics, MEMS, and Nanotechnology (11 Dec 2005 - 14 Dec 2005 : Brisbane, Australia)
Editor: Bender, A.
Statement of
Talis Putnins, Domenic J. Signoriello, Samant Jain, Matthew J. Berryman, and Derek Abbott
Abstract: Authorship attribution has a range of applications in a growing number of fields such as forensic evidence, plagiarism detection, email filtering, and web information management. In this study, three attribution techniques are extended, tested on a corpus of English texts, and applied to a book in the New Testament of disputed authorship. The word recurrence interval based method compares standard deviations of the number of words between successive occurrences of a keyword both graphically and with chi-squared tests. The trigram Markov method compares the probabilities of the occurrence of words conditional on the preceding two words to determine the similarity between texts. The third method extracts stylometric measures such as the frequency of occurrence of function words and from these constructs text classification models using multiple discriminant analysis. The effectiveness of these techniques is compared. The accuracy of the results obtained by some of these extended methods is higher than many of the current state of the art approaches. Statistical evidence is presented about the authorship of the selected book from the New Testament.
Description: © 2006 COPYRIGHT SPIE--The International Society for Optical Engineering
DOI: 10.1117/12.639281
Published version:
Appears in Collections:Aurora harvest 2
Electrical and Electronic Engineering publications

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