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Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/62166
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dc.contributor.authorKaushik, M.-
dc.contributor.authorNg, B.-
dc.contributor.authorFischer, B.-
dc.contributor.authorAbbott, D.-
dc.date.issued2010-
dc.identifier.citationProceedings of the 35th International Conference on Infrared, Millimeter, and Terahertz Waves,(IRMMW-THz 2010), held in Rome Italy 5-10 September 2010: pp.1-2-
dc.identifier.isbn9781424466566-
dc.identifier.urihttp://hdl.handle.net/2440/62166-
dc.description.abstractScattering is a major problem in precise measurement of quasi-optical parameters of material samples. In this paper, we review some popular scattering mitigating techniques and propose a novel method that allows calculating true absorption spectra for samples with unknown thickness and granularity.-
dc.description.statementofresponsibilityMayank Kaushik, Brian W.-H. Ng, Bernd M. Fischer, and Derek Abbott-
dc.language.isoen-
dc.publisherIEEE-
dc.rightsCopyright 2010 IEEE-
dc.source.urihttp://dx.doi.org/10.1109/icimw.2010.5612470-
dc.titleMitigating scattering effects in THz-TDS measurements-
dc.typeConference paper-
dc.contributor.conferenceIRMMW-THz 2010 (35th : 2010 : Rome, Italy)-
dc.identifier.doi10.1109/ICIMW.2010.5612470-
dc.publisher.placeUSA-
pubs.publication-statusPublished-
dc.identifier.orcidNg, B. [0000-0002-8316-4996]-
dc.identifier.orcidAbbott, D. [0000-0002-0945-2674]-
Appears in Collections:Aurora harvest 5
Electrical and Electronic Engineering publications

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