Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/70397
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dc.contributor.authorKaushik, M.-
dc.contributor.authorNg, B.-
dc.contributor.authorFischer, B.-
dc.contributor.authorAbbott, D.-
dc.date.issued2012-
dc.identifier.citationIEEE Photonics Technology Letters, 2012; 24(2):155-157-
dc.identifier.issn1041-1135-
dc.identifier.issn1941-0174-
dc.identifier.urihttp://hdl.handle.net/2440/70397-
dc.description.abstractThe scattering of terahertz radiation from the granular nature of a sample can potentially distort or obscure its characteristic spectral features. Several techniques have been proposed to reduce the effects of scattering in terahertz time-domain spectroscopy (THz-TDS) measurements, that usually require a complex measurement apparatus or rely on specific information about the sample under study. However, in real-world applications a priori information of the sample is not always known and therefore the applicability of these techniques may be limited. In this letter, we present a method for estimating and mitigating scattering effects in THz-TDS measurements for samples made of material exhibiting sharp and sparse absorption features, without requiring information of its granularity, refractive index, and density.-
dc.description.statementofresponsibilityMayank Kaushik, Brian W.-H. Ng, Bernd M. Fischer and Derek Abbott-
dc.language.isoen-
dc.publisherIEEE-Inst Electrical Electronics Engineers Inc-
dc.rights© 2011 British Crown Copyright-
dc.source.urihttp://dx.doi.org/10.1109/lpt.2011.2174980-
dc.subjectScattering-
dc.subjectteratertz spectroscopy.-
dc.titleReduction of scattering effects in THz-TDS signals-
dc.typeJournal article-
dc.identifier.doi10.1109/LPT.2011.2174980-
pubs.publication-statusPublished-
dc.identifier.orcidNg, B. [0000-0002-8316-4996]-
dc.identifier.orcidAbbott, D. [0000-0002-0945-2674]-
Appears in Collections:Aurora harvest
Electrical and Electronic Engineering publications

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