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Type: Journal article
Title: Modeling the influence of short term depression in vesicle release and stochastic calcium channel gating on auditory nerve spontaneous firing statistics
Author: Moezzi, B.
Iannella, N.
McDonnell, M.
Citation: Frontiers in Computational Neuroscience, 2014; 8(Dec):163-1-163-12
Publisher: Frontiers Research Foundation
Issue Date: 2014
ISSN: 1662-5188
Statement of
Bahar Moezzi, Nicolangelo Iannella and Mark D. McDonnell
Abstract: We propose several modifications to an existing computational model of stochastic vesicle release in inner hair cell ribbon synapses, with the aim of producing simulated auditory nerve fiber spiking data that more closely matches empirical data. Specifically, we studied the inter-spike-interval (ISI) distribution, and long and short term ISI correlations in spontaneous spiking in post-synaptic auditory nerve fibers. We introduced short term plasticity to the pre-synaptic release probability, in a manner analogous to standard stochastic models of cortical short term synaptic depression. This modification resulted in a similar distribution of vesicle release intervals to that estimated from empirical data. We also introduced a biophysical stochastic model of calcium channel opening and closing, but showed that this model is insufficient for generating a match with empirically observed spike correlations. However, by combining a phenomenological model of channel noise and our short term depression model, we generated short and long term correlations in auditory nerve spontaneous activity that qualitatively match empirical data.
Keywords: calcium dynamics, stochastic synapse, inner hair cell, auditory nerve, short term depression, neural variability, channel noise
Description: Published online: 23 December 2014.
Rights: © 2014 Moezzi, Iannella and McDonnell. This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) or licensor are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.
RMID: 0030018762
DOI: 10.3389/fncom.2014.00163
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Appears in Collections:Electrical and Electronic Engineering publications

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