Resonator power to frequency conversion in a cryogenic sapphire oscillator

Simple item page
dc.contributor.authorNand, N.
dc.contributor.authorParker, S.
dc.contributor.authorIvanov, E.
dc.contributor.authorLe Floch, J.
dc.contributor.authorHartnett, J.
dc.contributor.authorTobar, M.
dc.contributor.organisationInstitute for Photonics & Advanced Sensing (IPAS)
dc.date.issued2013
dc.description.abstractWe report on the measurement and characterization of power to frequency conversion in the resonant mode of a cryogenic sapphire loaded cavity resonator, which is used as the frequency discriminating element of a loop oscillator circuit. Fluctuations of power incident on the resonator lead to changes in radiation pressure and temperature in the sapphire dielectric, both of which contribute to a shift in the resonance frequency. We measure a modulation and temperature independent radiation pressure induced power to frequency sensitivity of −0.15 Hz/mW and find that this is the primary factor limiting the stability of the resonator frequency.
dc.description.statementofresponsibilityNitin R. Nand, Stephen R. Parker, Eugene N. Ivanov, Jean-Michel le Floch, John G. Hartnett, and Michael E. Tobar
dc.identifier.citationApplied Physics Letters, 2013; 103(4):043502-1-043502-4
dc.identifier.doi10.1063/1.4816284
dc.identifier.issn0003-6951
dc.identifier.issn1077-3118
dc.identifier.urihttp://hdl.handle.net/2440/79823
dc.language.isoen
dc.publisherAmer Inst Physics
dc.relation.granthttp://purl.org/au-research/grants/arc/LP0883292
dc.relation.granthttp://purl.org/au-research/grants/arc/DP130100205
dc.relation.granthttp://purl.org/au-research/grants/arc/CE1101013
dc.relation.granthttp://purl.org/au-research/grants/arc/FL0992016
dc.rights© 2013 AIP Publishing LLC
dc.source.urihttps://doi.org/10.1063/1.4816284
dc.titleResonator power to frequency conversion in a cryogenic sapphire oscillator
dc.typeJournal article
pubs.publication-statusPublished

Files

Collections

IPAS publications