Determination of Youngs Modulus of Ultrathin Nanomaterials

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dc.contributor.authorChen, Y.
dc.contributor.authorGao, Q.
dc.contributor.authorWang, Y.
dc.contributor.authorAn, X.
dc.contributor.authorLiao, X.
dc.contributor.authorMai, Y.W.
dc.contributor.authorTan, H.H.
dc.contributor.authorZou, J.
dc.contributor.authorRinger, S.P.
dc.contributor.authorJagadish, C.
dc.date.issued2015
dc.description.abstractDetermination of the elastic modulus of nanostructures with sizes at several nm range is a challenge. In this study, we designed an experiment to measure the elastic modulus of amorphous Al2O3 films with thicknesses varying between 2 and 25 nm. The amorphous Al2O3 was in the form of a shell, wrapped around GaAs nanowires, thereby forming an effective core/shell structure. The GaAs core comprised a single crystal structure with a diameter of 100 nm. Combined in situ compression transmission electron microscopy and finite element analysis were used to evaluate the elastic modulus of the overall core/shell nanowires. A core/shell model was applied to deconvolute the elastic modulus of the Al2O3 shell from the core. The results indicate that the elastic modulus of amorphous Al2O3 increases significantly when the thickness of the layer is smaller than 5 nm. This novel nanoscale material can be attributed to the reconstruction of the bonding at the surface of the material, coupled with the increase of the surface-to-volume ratio with nanoscale dimensions. Moreover, the experimental technique and analysis methods presented in this study may be extended to measure the elastic modulus of other materials with dimensions of just several nanometers.
dc.description.statementofresponsibilityYujie Chen, Qiang Gao, Yanbo Wang, Xianghai An, Xiaozhou Liao, Yiu-Wing Mai, H. Hoe Tan, Jin Zou, Simon P. Ringer, and Chennupati Jagadish
dc.identifier.citationNano Letters: a journal dedicated to nanoscience and nanotechnology, 2015; 15(8):5279-5283
dc.identifier.doi10.1021/acs.nanolett.5b01603
dc.identifier.issn1530-6984
dc.identifier.issn1530-6992
dc.identifier.orcidChen, Y. [0000-0002-6588-6266]
dc.identifier.urihttps://hdl.handle.net/2440/135771
dc.language.isoen
dc.publisherAmerican Chemical Society (ACS)
dc.relation.grantARC
dc.rights© 2015 American Chemical Society
dc.source.urihttps://doi.org/10.1021/acs.nanolett.5b01603
dc.subjectYoung’s modulus
dc.subjectin situ deformation
dc.subjectsize effect
dc.subjecttransmission electron microscopy
dc.titleDetermination of Youngs Modulus of Ultrathin Nanomaterials
dc.typeJournal article
pubs.publication-statusPublished

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