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Use of TOF-SIMS to Study Adsorption and Loading Behavior of Methylene Blue and Papain in a Nano-Porous Silicon Layer

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dc.contributor.authorKempson, I.M.
dc.contributor.authorBarnes, T.J.
dc.contributor.authorPrestidge, C.A.
dc.date.issued2010
dc.description.abstractTOF-SIMS was applied to study the cross-sectional distribution of methylene blue and papain in porous silicon layers. Elemental and molecular information were used to study their distributions in the porous region and the chemistry of their adsorption. Methylene blue (MW = 284 Da) penetrated to the base to the pores. Positive ions (SiCH(3)(+)) suggest methylene blue binds to the substrate via its methyl groups. Negative fragments (SiOSH(3)(-) and SiO(2)SCH(-)) also suggested chemisorption via O bridging of the substrate Si and methylene blue S. The larger Papain molecule (23,406 Da) distributed itself in a similar manner to methylene blue demonstrating larger molecules can be effectively incorporated into such pore structures.
dc.identifier.citationJournal of the American Society for Mass Spectrometry, 2010; 21(2):254-260
dc.identifier.doi10.1016/j.jasms.2009.10.007
dc.identifier.issn1044-0305
dc.identifier.issn1879-1123
dc.identifier.orcidKempson, I.M. [0000-0002-3886-9516]
dc.identifier.urihttps://hdl.handle.net/1959.8/75749
dc.language.isoen
dc.publisherELSEVIER SCIENCE INC
dc.relation.granthttp://purl.org/au-research/grants/arc/LP0562379
dc.rightsCopyright 2010 American Society for Mass Spectrometry
dc.source.urihttps://doi.org/10.1016/j.jasms.2009.10.007
dc.subjectSilicon
dc.subjectMethylene Blue
dc.subjectPapain
dc.subjectAdsorption
dc.subjectPorosity
dc.subjectNanostructures
dc.subjectMass Spectrometry
dc.titleUse of TOF-SIMS to Study Adsorption and Loading Behavior of Methylene Blue and Papain in a Nano-Porous Silicon Layer
dc.typeJournal article
pubs.publication-statusPublished
ror.mmsid9915910611501831

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