Simple material parameter estimation via terahertz time-domain spectroscopy
Date
2005
Authors
Withayachumnankul, W.
Ferguson, B.
Rainsford, T.
Mickan, S.
Abbott, D.
Editors
Advisors
Journal Title
Journal ISSN
Volume Title
Type:
Journal article
Citation
Electronics Letters, 2005; 41(14):800-801
Statement of Responsibility
W. Withayachumnankul, B. Ferguson, T. Rainsford, S.P. Mickan, and D. Abbott
Conference Name
Abstract
A simple and precise method based on fixed-point iteration is used to estimate dielectric parameters using terahertz time-domain spectroscopy (THz-TDS). The method converges and gives correct parameters when the sample thickness is greater than 200 mm at a frequency of 0.1 THz or 20 mm at a frequency of 1.0 THz. The technique in validated using measured terahertz data, obtained by probing a sample of high-resistivity silicon.
School/Discipline
Dissertation Note
Provenance
Description
© 2005 Institution of Engineering and Technology