Simple material parameter estimation via terahertz time-domain spectroscopy

Date

2005

Authors

Withayachumnankul, W.
Ferguson, B.
Rainsford, T.
Mickan, S.
Abbott, D.

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Electronics Letters, 2005; 41(14):800-801

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W. Withayachumnankul, B. Ferguson, T. Rainsford, S.P. Mickan, and D. Abbott

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Abstract

A simple and precise method based on fixed-point iteration is used to estimate dielectric parameters using terahertz time-domain spectroscopy (THz-TDS). The method converges and gives correct parameters when the sample thickness is greater than 200 mm at a frequency of 0.1 THz or 20 mm at a frequency of 1.0 THz. The technique in validated using measured terahertz data, obtained by probing a sample of high-resistivity silicon.

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© 2005 Institution of Engineering and Technology

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