Investigation of critical slowing down in a bistable S-SEED

dc.contributor.authorClare, B.
dc.contributor.authorCorbett, K.
dc.contributor.authorGrant, K.
dc.contributor.authorAtanackovic, P.
dc.contributor.authorMarwood, W.
dc.contributor.authorMunch, J.
dc.date.issued2003
dc.description.abstractA simulation of S-SEED switching based upon experimental data is developed that includes the effect of critical slowing down. The simulation's accuracy is demonstrated by close agreement with the results from experimental S-SEED switching. The simulation is subsequently used to understand how the phenomenon of critical slowing down applies to switching of an S-SEED and how the effect on photonic analog-to-digital (A/D) converter performance may be minimized.
dc.description.statementofresponsibilityB. A. Clare, K. A. Corbett, K. J. Grant, P. B. Atanackovic, W. Marwood and J. Munch
dc.identifier.citationJournal of Lightwave Technology, 2003; 21(11):2883-2890
dc.identifier.doi10.1109/JLT.2003.817713
dc.identifier.issn0733-8724
dc.identifier.issn1558-2213
dc.identifier.urihttp://hdl.handle.net/2440/18127
dc.language.isoen
dc.publisherIEEE-Inst Electrical Electronics Engineers Inc
dc.rights© 2003 IEEE.
dc.source.urihttp://www.opticsinfobase.org/jlt/abstract.cfm?uri=jlt-21-11-2883
dc.subjectCritical slowing down
dc.subjectoptical bistability
dc.subjectself-electrooptic-effect device (SEED)
dc.titleInvestigation of critical slowing down in a bistable S-SEED
dc.typeJournal article
pubs.publication-statusPublished

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