1/f, g-r and burst noise used as a screening threshold for reliability estimation of optoelectronic coupled devices
Date
2000
Authors
Xu, J.
Abbott, D.
Dai, Y.
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Journal article
Citation
Microelectronics Reliability, 2000; 40(1):171-178
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Abstract
In this paper the theoretical analysis of noise sources in Optoelectronic Coupled Devices (OCDs) is given and the relation between typical defects and 1/f, g–r and burst noise is described. According to statistical and experimental results, a threshold to screen potential devices with excess noise is derived, which has been proved theoretically that the screening criterion is reasonable. Moreover, the experimental results show that the method is of practical value.