Frequency stability and phase noise of an improved X-band cryocooled sapphire oscillator
Date
2010
Authors
Nand, N.R.
Hartnett, J.G.
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Conference paper
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2010 IEEE International Frequency Control Symposium, FCS 2010, 2010, pp.670-673
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Nitin R. Nand and John G. Hartnett
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2010 IEEE International Frequency Control Symposium (FCS 2010) (1 Jun 2010 - 4 Jun 2010 : Newport Beach, CA)
Abstract
A previously implemented cryogenic sapphire oscillator (CSO) based on a commercial cryocooler has been modified and its frequency stability and phase noise re-measured against a nominally similar liquid helium cooled CSO in the same laboratory. Assuming both contribute equally, their frequency stability and phase noise have been evaluated. We report for the oscillator a minimum Allan deviation of 3.9 × 10-16 at 20 s, a long-term frequency drift less than 1 × 10-14/day, and a measured single sideband phase noise of -97 dBc/Hz at 1 Hz offset from the carrier. The stated performance of the cryocooled CSO is adequate for it to be deployed at a local VLBI site for comparison against the hydrogen maser which is the current reference standard.
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© 2010 IEEE