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NEXAFS N K-edge study of the bonding structure on Al/Si doped sputtered CrN coatings

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dc.contributor.authorRahman, M.
dc.contributor.authorJiang, Z.
dc.contributor.authorDuan, X.
dc.contributor.authorXie, Z.
dc.contributor.authorTadich, A.
dc.contributor.authorZhou, Z.
dc.contributor.authorMondinos, N.
dc.contributor.authorYin, C.
dc.contributor.authorAltarawneh, M.
dc.contributor.authorDlugogorski, B.
dc.date.issued2016
dc.description.abstractAbstract not available
dc.description.statementofresponsibilityM. Mahbubur Rahman, Zhong-Tao Jiang, Xiaofei Duan, Zonghan Xie, Anton Tadich, Zhi-feng Zhou, Nicholas Mondinos, Chun-Yang Yin, Mohammednoor Altarawneh, Bogdan Z. Dlugogorski
dc.identifier.citationJournal of Alloys and Compounds, 2016; 661:268-273
dc.identifier.doi10.1016/j.jallcom.2015.11.128
dc.identifier.issn0925-8388
dc.identifier.issn1873-4669
dc.identifier.urihttp://hdl.handle.net/2440/114737
dc.language.isoen
dc.publisherElsevier
dc.rights© 2015 Elsevier B.V. All rights reserved.
dc.source.urihttps://doi.org/10.1016/j.jallcom.2015.11.128
dc.subjectCrNₓ coatings; doping; synchrotron radiation; NEXAFS; electronic structure; sputtering; grain boundary
dc.titleNEXAFS N K-edge study of the bonding structure on Al/Si doped sputtered CrN coatings
dc.typeJournal article
pubs.publication-statusPublished

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