Secondary ion mass spectrometry in the analysis of trace metal distribution in the annual growth rings of trees
Date
1997
Authors
Martin, R.R.H.
Furimsky, E.
Jain, J.
Skinner, W.M.
Editors
Subramanian, K.
Iyengar, G.
Iyengar, G.
Advisors
Journal Title
Journal ISSN
Volume Title
Type:
Book chapter
Citation
Source details - Title: Environmental biomonitoring: exposure assessment and specimen banking, 1997 / Subramanian, K., Iyengar, G. (ed./s), vol.654, Ch.3, pp.30-41
Statement of Responsibility
Conference Name
Abstract
Secondary Ion Mass Spectroscopy (SIMS) was used to measure the distribution of trace metals in the annual growth rings of Eastern white pine (Pinus strobus L.) at selected sites throughout Southern Ontario, Canada. Previous results show systematic variation in individual metals between trees at different sites in rings corresponding to the same year, and between different years at the same site. In this work SIMS imaging combined with Scanning Electron Microscopy (SEM) has shown that trace metals are often confined to regions a few microns in size throughout the ring structure. In addition, there is evidence for marked seasonal variation in the metal content within individual rings. Finally, Inductively Coupled Plasma Mass Spectroscopy (ICP/MS) has been used to calibrate SIMS secondary ion yields so that rough quantisation of SIMS data is possible.
School/Discipline
Dissertation Note
Provenance
Description
Access Status
Rights
Copyright 1997 American Chemical Society