Identification of crack locations and extents by Bayesian model class selection

Date

2007

Authors

Lam, H.
Ng, C.
Katafygiotis, L.

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Conference paper

Citation

Proceedings of the World Forum on Smart Materials and Smart Structures Technology (SMSST 07), held in China, 22-27 May, 2007 / M. Tomizuka, R.W. Chen, C.B. Yun, B.F. Spencer and W.M. Chen (eds.): Ch.90 pp. 213-214

Statement of Responsibility

H.F. Lam, C.T. Ng and L.S. Katafygiotis

Conference Name

World Forum on Smart Materials and Smart Structures Technology (SMSST 07) (2007 : China)

Abstract

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© 2008 Taylor & Francis Group

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