Identification of crack locations and extents by Bayesian model class selection
Date
2007
Authors
Lam, H.
Ng, C.
Katafygiotis, L.
Editors
Advisors
Journal Title
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Type:
Conference paper
Citation
Proceedings of the World Forum on Smart Materials and Smart Structures Technology (SMSST 07), held in China, 22-27 May, 2007 / M. Tomizuka, R.W. Chen, C.B. Yun, B.F. Spencer and W.M. Chen (eds.): Ch.90 pp. 213-214
Statement of Responsibility
H.F. Lam, C.T. Ng and L.S. Katafygiotis
Conference Name
World Forum on Smart Materials and Smart Structures Technology (SMSST 07) (2007 : China)
Abstract
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© 2008 Taylor & Francis Group