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Effects of crystal thickness in localized terahertz generation via optical rectification in ZnTe - preliminary investigation

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dc.contributor.authorLin, H.
dc.contributor.authorUng, B.
dc.contributor.authorFischer, B.
dc.contributor.authorMickan, S.
dc.contributor.authorAbbott, D.
dc.contributor.conferenceIRMMW - THz 2009 (34th : 2009 : Korea)
dc.date.issued2009
dc.description.abstractMany techniques have been proposed in the literature with an aim of breaking the diffraction limit for THz imaging. The thin crystal in electro-optical based technique has been reported to generate THz power enhancement. This, however, is counter-intuitive as thicker crystals provide a greater volume for optical rectification and hence should generate more power. This paper therefore investigates THz optical rectification with thin crystal experimentally.
dc.description.statementofresponsibilityHungyen Lin, Benjamin Seam Yu Ung, Bernd M. Fischer, Samuel P. Mickan and Derek Abbott
dc.identifier.citationProceeding of the 34th International Conference on Infrared, Millimeter, and Terahertz Wave, 2009: pp 1-2
dc.identifier.doi10.1109/ICIMW.2009.5325560
dc.identifier.isbn9781424454174
dc.identifier.orcidAbbott, D. [0000-0002-0945-2674]
dc.identifier.urihttp://hdl.handle.net/2440/55062
dc.language.isoen
dc.publisherIEEE
dc.publisher.placeCD
dc.rightsCopyright 2009 IEEE
dc.source.urihttps://doi.org/10.1109/ICIMW.2009.5325560
dc.titleEffects of crystal thickness in localized terahertz generation via optical rectification in ZnTe - preliminary investigation
dc.typeConference paper
pubs.publication-statusPublished

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