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https://hdl.handle.net/2440/113799
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Type: | Journal article |
Title: | A new thermographic NDT for condition monitoring of electrical components using ANN with confidence level analysis |
Author: | Huda, A. Taib, S. Ghazali, K. Jadin, M. |
Citation: | ISA Transactions, 2014; 53(3):717-724 |
Publisher: | Elsevier |
Issue Date: | 2014 |
ISSN: | 0019-0578 |
Statement of Responsibility: | A.S.N.Huda, S.Taib, K.H.Ghazali, M.S.Jadin |
Abstract: | Abstract not available |
Keywords: | Condition; MLP network; confidence level; infrared thermography; electrical components |
Rights: | © 2014 ISA.Published by Elsevier Ltd. All rights reserved. |
DOI: | 10.1016/j.isatra.2014.02.003 |
Published version: | http://dx.doi.org/10.1016/j.isatra.2014.02.003 |
Appears in Collections: | Aurora harvest 8 Electrical and Electronic Engineering publications |
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