Please use this identifier to cite or link to this item: http://hdl.handle.net/2440/16586
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Type: Journal article
Title: Simple material parameter estimation via terahertz time-domain spectroscopy
Author: Withayachumnankul, W.
Ferguson, B.
Rainsford, T.
Mickan, S.
Abbott, D.
Citation: Electronics Letters, 2005; 41(14):800-801
Publisher: IEE-Inst Elec Eng
Issue Date: 2005
ISSN: 0013-5194
Statement of
Responsibility: 
W. Withayachumnankul, B. Ferguson, T. Rainsford, S.P. Mickan, and D. Abbott
Abstract: A simple and precise method based on fixed-point iteration is used to estimate dielectric parameters using terahertz time-domain spectroscopy (THz-TDS). The method converges and gives correct parameters when the sample thickness is greater than 200 mm at a frequency of 0.1 THz or 20 mm at a frequency of 1.0 THz. The technique in validated using measured terahertz data, obtained by probing a sample of high-resistivity silicon.
Description: © 2005 Institution of Engineering and Technology
RMID: 0020050724
DOI: 10.1049/el:20051467
Appears in Collections:Electrical and Electronic Engineering publications

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