Single grating x-ray imaging for dynamic biological systems
Date
2012
Authors
Morgan, K.
Paganin, D.
Parsons, D.
Donnelly, M.
Yagi, N.
Uesugi, K.
Suzuki, Y.
Takeuchi, A.
Siu, K.
Editors
Momose, A.
Yashiro, W.
Yashiro, W.
Advisors
Journal Title
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Volume Title
Type:
Conference paper
Citation
AIP Conference Proceedings, 2012 / Momose, A., Yashiro, W. (ed./s), vol.1466, pp.124-129
Statement of Responsibility
Kaye S. Morgan, David M. Paganin, David W. Parsons, Martin Donnelley, Naoto Yagi, Kentaro Uesugi, Yoshio Suzuki, Akihisa Takeuchi and Karen K.W. Siu
Conference Name
International Workshop on X-Ray and Neutron Phase Imaging with Gratings (5 Mar 2012 - 7 Mar 2012 : Tokyo, Japan)
Abstract
Biomedical studies are already benefiting from the excellent contrast offered by phase contrast x-ray imaging, but live imaging work presents several challenges. Living samples make it particularly difficult to achieve high resolution, sensitive phase contrast images, as exposures must be short and cannot be repeated. We therefore present a single-exposure, high-flux method of differential phase contrast imaging [1, 2, 3] in the context of imaging live airways for Cystic Fibrosis (CF) treatment assessment [4]. The CF study seeks to non-invasively observe the liquid lining the airways, which should increase in depth in response to effective treatments. Both high spatial resolution and sensitivity are required in order to track micron size changes in a liquid that is not easily differentiated from the tissue on which it lies. Our imaging method achieves these goals by using a single attenuation grating or grid as a reference pattern, and analyzing how the sample deforms the pattern to quantitatively retrieve the phase depth of the sample. The deformations are mapped at each pixel in the image using local cross-correlations comparing each ‘sample and pattern’ image with a reference ‘pattern only’ image taken before the sample is introduced. This produces a differential phase image, which may be integrated to give the sample phase depth.
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© 2012 American Institute of Physics