Simplified three-cornered-hat technique for frequency stability measurements

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dc.contributor.authorGunn, L.
dc.contributor.authorCatlow, P.
dc.contributor.authorAl-Ashwal, W.
dc.contributor.authorHartnett, J.
dc.contributor.authorAllison, A.
dc.contributor.authorAbbott, D.
dc.contributor.organisationInstitute for Photonics & Advanced Sensing (IPAS)
dc.date.issued2014
dc.description.abstractWe propose a novel technique allowing the use of the three-cornered-hat method with two devices under test (DUTs) and a time-tagging system that employs a common reference oscillator. The precision of a time-tagging system is reduced by fluctuations in the timebase, which are canceled when the relative phase between the two DUTs is measured. However, the raw time-tags in this system provide a phase comparison between the DUTs and the system timebase, allowing the use of the three-cornered hat with some dual-channel measurement instruments.
dc.description.statementofresponsibilityLachlan J. Gunn, Peter G. Catlow, Waddah A. Al-Ashwal, John G. Hartnett, Andrew Allison, and Derek Abbott.
dc.identifier.citationIEEE Transactions on Instrumentation and Measurement, 2014; 63(4):889-895
dc.identifier.doi10.1109/TIM.2013.2285796
dc.identifier.issn0018-9456
dc.identifier.issn1557-9662
dc.identifier.orcidAl-Ashwal, W. [0000-0003-0445-1354]
dc.identifier.orcidAllison, A. [0000-0003-3865-511X]
dc.identifier.orcidAbbott, D. [0000-0002-0945-2674]
dc.identifier.urihttp://hdl.handle.net/2440/83000
dc.language.isoen
dc.publisherIEEE-Inst Electrical Electronics Engineers Inc
dc.rights©2013 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission.
dc.source.urihttps://doi.org/10.1109/tim.2013.2285796
dc.subjectFrequency stability
dc.subjectnoise measurement
dc.subjectphase noise
dc.subjecttest equipment
dc.subjectthree-cornered-hat method.
dc.titleSimplified three-cornered-hat technique for frequency stability measurements
dc.typeJournal article
pubs.publication-statusPublished

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