Material parameter extraction for terahertz time-domain spectroscopy using fixed-point iteration
Date
2005
Authors
Withayachumnankul, W.
Ferguson, B.
Rainsford, T.
Mickan, S.
Abbott, D.
Editors
Badenes, G.
Abbott, D.
Serpenguzel, A.
Abbott, D.
Serpenguzel, A.
Advisors
Journal Title
Journal ISSN
Volume Title
Type:
Conference paper
Citation
Photonic materials, devices, and applications : 9-11 May, 2005, Seville, Spain / Gonçal Badenes, Derek Abbott, Ali Serpengüzel (eds.), 2005. pp.221-231
Statement of Responsibility
W. Withayachumnankul, B. Ferguson, T. Rainsford, S. P. Mickan, and D. Abbott
Conference Name
Photonic materials, devices, and applications (2005 : Seville, Spain)
Abstract
A simple method to extract the far-infrared dielectric parameters of a homogeneous material from terahertz signals is explored in this paper. Provided with a reference, sample-probing terahertz signal and a known sample thickness, the method can determine the underlying complex refractive index of the sample within a few iterations based on the technique of fixed-point iteration. The iterative process is guaranteed to converge and gives the correct parameters when the material thickness exceeds 200 μm at a frequency of 0.1 THz or 20 μm at a frequency of 1.0 THz.
School/Discipline
Dissertation Note
Provenance
Description
© 2005 COPYRIGHT SPIE--The International Society for Optical Engineering