Material parameter extraction for terahertz time-domain spectroscopy using fixed-point iteration
| dc.contributor.author | Withayachumnankul, W. | |
| dc.contributor.author | Ferguson, B. | |
| dc.contributor.author | Rainsford, T. | |
| dc.contributor.author | Mickan, S. | |
| dc.contributor.author | Abbott, D. | |
| dc.contributor.conference | Photonic materials, devices, and applications (2005 : Seville, Spain) | |
| dc.contributor.editor | Badenes, G. | |
| dc.contributor.editor | Abbott, D. | |
| dc.contributor.editor | Serpenguzel, A. | |
| dc.date.issued | 2005 | |
| dc.description | © 2005 COPYRIGHT SPIE--The International Society for Optical Engineering | |
| dc.description.abstract | A simple method to extract the far-infrared dielectric parameters of a homogeneous material from terahertz signals is explored in this paper. Provided with a reference, sample-probing terahertz signal and a known sample thickness, the method can determine the underlying complex refractive index of the sample within a few iterations based on the technique of fixed-point iteration. The iterative process is guaranteed to converge and gives the correct parameters when the material thickness exceeds 200 μm at a frequency of 0.1 THz or 20 μm at a frequency of 1.0 THz. | |
| dc.description.statementofresponsibility | W. Withayachumnankul, B. Ferguson, T. Rainsford, S. P. Mickan, and D. Abbott | |
| dc.identifier.citation | Photonic materials, devices, and applications : 9-11 May, 2005, Seville, Spain / Gonçal Badenes, Derek Abbott, Ali Serpengüzel (eds.), 2005. pp.221-231 | |
| dc.identifier.doi | 10.1117/12.612946 | |
| dc.identifier.isbn | 081945835X | |
| dc.identifier.issn | 0277-786X | |
| dc.identifier.issn | 1996-756X | |
| dc.identifier.orcid | Withayachumnankul, W. [0000-0003-1155-567X] | |
| dc.identifier.orcid | Abbott, D. [0000-0002-0945-2674] | |
| dc.identifier.uri | http://hdl.handle.net/2440/44150 | |
| dc.language.iso | en | |
| dc.publisher | SPIE | |
| dc.publisher.place | Online | |
| dc.relation.ispartofseries | PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE) | |
| dc.source.uri | https://doi.org/10.1117/12.612946 | |
| dc.title | Material parameter extraction for terahertz time-domain spectroscopy using fixed-point iteration | |
| dc.type | Conference paper | |
| pubs.publication-status | Published |