Quantitative prediction of phase transformations in silicon during nanoindentation

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dc.contributor.authorZhang, L.
dc.contributor.authorBasak, A.
dc.date.issued2013
dc.description.abstractThis paper establishes the first quantitative relationship between the phases transformed in silicon and the shape characteristics of nanoindentation curves. Based on an integrated analysis using TEM and unit cell properties of phases, the volumes of the phases emerged in a nanoindentation are formulated as a function of pop-out size and depth of nanoindentation impression. This simple formula enables a fast, accurate and quantitative prediction of the phases in a nanoindentation cycle, which has been impossible before.
dc.description.statementofresponsibilityLiangchi Zhang and Animesh Basak
dc.identifier.citationPhilosophical Magazine Letters: structure and properties of condensed matter, 2013; 93(8):448-456
dc.identifier.doi10.1080/09500839.2013.798441
dc.identifier.issn0950-0839
dc.identifier.issn1362-3036
dc.identifier.orcidBasak, A. [0000-0003-2301-4758]
dc.identifier.urihttp://hdl.handle.net/2440/112426
dc.language.isoen
dc.publisherTaylor & Francis
dc.relation.grantARC
dc.rights© 2013 Taylor & Francis
dc.source.urihttps://doi.org/10.1080/09500839.2013.798441
dc.subjectPhase transformation; silicon; quantitative prediction; nanoindentation
dc.titleQuantitative prediction of phase transformations in silicon during nanoindentation
dc.typeJournal article
pubs.publication-statusPublished

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