Aggregation behavior of ligand-protected Au₉ clusters on sputtered atomic layer deposition TiO₂
Date
2017
Authors
Al Qahtani, H.
Metha, G.
Walsh, R.
Golovko, V.
Andersson, G.
Nakayama, T.
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Journal article
Citation
The Journal of Physical Chemistry C: Energy Conversion and Storage, Optical and Electronic Devices, Interfaces, Nanomaterials, and Hard Matter, 2017; 121(20):10781-10789
Statement of Responsibility
Hassan S. Al Qahtani, Gregory F. Metha, Rick B. Walsh, Vladimir B. Golovko, Gunther G. Andersson, and Tomonobu Nakayama
Conference Name
Abstract
[Au₉(PPh₃)₈)](NO₃)₃ (Au)₉ clusters were deposited onto sputtered ALD titania surfaces. Atomic force microscopy (AFM) was used to determine the height and distributions of the Au₉ clusters over the titania surface fabricated using atomic layer deposition (ALD). Synchrotron X-ray photoelectron spectroscopy (XPS) was used to derive information about the degree of agglomeration of the Au₉ clusters due to the annealing process. Both AFM and XPS show that the Au₉ clusters deposited on ALD titania are partially agglomerated after annealing. Deposition of the [Au₉(PPh₃)₈)](NO₃)₃ clusters on sputtered ALD titania is compared with deposition of the same cluster on titania nanosheets of previous work.
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© 2017 American Chemical Society